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98 % reduction of interface defect state density compared to existing methods

III-V semiconductor materials such as GaAs, GaN, InGaAs, GaSb, InP, InAs, or InSb present high surface state densities due to the formation of native oxides. This leads to harmful physical phenomena like Fermi-level pinning and surface recombination which deteriorate the device performance in microelectronic and optoelectronic fields. For example, the surface states will cause charge carrier losses and decrease the photoelectric conversion efficiency in solar cells and detectors; In the semiconductor lasers, the surface states in the facets of laser cavity will cause unwanted absorption of the laser light and reduce the laser emission efficiency and even leads to catastrophic optical mirror damage; In metal oxide semiconductor field-effect transistors (MOSFET) the surface state will cause poor channel modulation, gate leakage, C-V dispersion, and hysteresis.

Thanks to the extensive expertise in semiconductor surface engineering, our team has developed a breakthrough technology to address the problem of native oxidation in compound semiconductor materials. We make the oxidation happen in a highly controlled manner so that the resulting surface is more resistant to oxidation. For the first time, we can promote surface crystalline oxide reconstructions on the surface of the III-V compound semiconductor materials. 

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Untreated semiconductor surface exhibits a large number of oxidation-induced defects


These atomic-level defects are ultimately an amorphous oxide and contaminations on top of the III-V crystal. This native oxide is naturally characterized by atomic-level
bond disorder, dangling bonds, and mixed group III and group V oxides

With Kontrox, the efficiency and performance of compound semiconductor devices are taken to record levels while manufacturing costs are significantly reduced.

III-V passivation - defected interface
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Scanning Tunneling Microscope (STM) images of III-V material with native oxide surface layer and with crystalline oxide reconstruction developed by Comptek Solutions.

These novel crystalline structures are thermodynamically stable which results in the passivation effect. They are characterized by unprecedented low levels of surface state densities. These properties narrow down the gap between theoretical and actual efficiency. Additionally, our solution helps to avoid the oxidation of the materials during the different manufacturing phases reducing the risk of defective parts and improving the manufacturing yields.

Discover more

Compound semiconductors

Compound semiconductors have been identified as one of the six key enabling technologies necessary for future industrial development.

Passivation of laser facets

Effective passivation of laser facets is the key to obtaining the highest power output of edge-emitting lasers. 

Passivation of MESA sidewalls

High-quality passivation of the sidewall is essential in realizing a power-efficient microLED-based display with the desired performance and pixel sizes.


We contribute to global environmental sustainability by improving the power efficiency of semiconductor components and optimizing their manufacturing process.