White paper:
 
Advanced PL measurement techniques for optoelectronic device characterization

When working with advanced optoelectronic devices such as µLEDs, utilizing different characterization techniques is required in order to gain a deeper insight into the factors defining the device performance and to understand the complex physical phenomena prevailing in the semiconductor devices/structures.

Comptek's know-how in state-of-the-art characterization techniques allows us to deliver precise and extensive device analysis and implement the most appropriate set of our proprietary cleaning- and passivation processes to achieve the best result for each optoelectronic device type. TRPL is especially powerful in characterizing µLED chips where the in-depth understanding of material’s properties is the key to realizing the next-generation µLED display.

snip_cover page.PNG

Download the white paper:

By entering your contact details you are  agreeing to Comptek's Privacy Policy.