White paper:
Advanced passivation for performance optimization in high-power edge-emitting laser diodes

Oxidation-induced defects in III-V compound semiconductor laser bar facets compromise the device quality and performance. Extending the power threshold where COMD occurs and maximizing their operational lifespan is a crucial objective for laser manufacturers.

Dive into our whitepaper to explore the challenges encountered in

the manufacturing of high-power edge-emitting laser diodes and