

Improving ALD-III-V interface quality with Kontrox for drastically enhanced device parameters
Improving ALD-III-V interface quality with Kontrox for drastically enhanced device parameters

Advanced PL measurement techniques for optoelectronic device characterization
When developing advanced optoelectronic devices such as µLEDs, sophisticated non-destructive
characterization methods are often required.

Novel GaN surface treatment to boost microLED efficiency
Comptek Solutions’ Kontrox™ is a powerful passivation technology that greatly reduces surface defect states density in III-V materials.